Experimental Investigation of White Layer Thickness on EDM Processed Silicon Steel Using ANFIS Approach

Tác giả: T. Muthuramalingam, D. Saravanakumar, L. Ganesh Babu, Nguyen Huu Phan & Vu Ngoc Pi

Nhà xuất bản: Silicon; https://doi.org/10.1007/s12633-019-00287-2